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Lab.ru Consulting | Manufacturers | ASTM Catalogue

	Number	Title
	E 2056	Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
	E 2069	Standard Test Method for Temperature Calibration on Cooling of Differential Scanning Calorimeters
	E 2070	Standard Test Method for Kinetic Parameters by Differential Scanning Calorimetry Using Isothermal Methods
	E 2071	Standard Practice for Calculating Heat of Vaporization or Sublimation from Vapor Pressure Data
	E 2078	Standard Guide for Analytical Data Interchange Protocol for Mass Spectrometric Data
	E 2092	Standard Test Method for Distortion Temperature in Three-Point Bending by Thermomechanical Analysis
	F 151	Standard Test Method for Residual Solvents in Flexible Barrier Materials
	F 372	Standard Test Method for Water Vapor Transmission Rate of Flexible Barrier Materials Using an Infrared Detection Technique
	F 576	Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
	F 624	Standard Guide for Evaluation of Thermoplastic Polyurethane Solids and Solutions for Biomedical Applications
	F 1188	Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption
	F 1308	Standard Test Method for Quantitating Volatile Extractables in Microwave Susceptors Used for Food Products
	F 1374	Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components
	F 1391	Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
	F 1500	Standard Test Method for Quantitating Non-UV-Absorbing Nonvolatile Extractables from Microwave Susceptors Utilizing Solvents as Food Simulants
	F 1519	Standard Test Method for Qualitative Analysis of Volatile Extractables in Microwave Susceptors Used to Heat Food Products
	F 1618	Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
	F 1619	Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle
	F 1630	Standard Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
	F 1723	Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy

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