||SPECTRO X-LAB 2000:
Setting the benchmark for high sensitivity energy dispersive X- ray fluorescence analysis (EDXRF)
Kleve, Germany -- July, 2003
The new SPECTRO X-LABa 2000 is equipped with a 400 W Pd end window X- ray tube. The excitation radiation is optimized using various polarization and secondary targets, the spectral background is reduced by up to an order of magnitude. As detection system a state-of-the-art high resolution Si(Li) semiconductor detector is selected due its excellent sensitivity for low and high energies at the same time. With this it is possible to analyze traces as well as majors in a wide range of applications very precisely. The optimized instrument design is supported by unique integrated software and is accepted as the benchmark for high sensitivity EDXRF.
End window tube
The Pd taget end window tube allows to use the low energy radiation for excitation of the light elements such as Na- Cl.
Polarized excitation reduces the background in the spectrum, which is created by scattering the excitation radiation at the sample. In comparison to a standard setup this background is reduced and the reachable detection limits are drastically lower.
Si(Li) detection systems allow the analysis of low and high energy fluorescence radiation at the same time. The resolution at a level of < 155 eV for Mn Ka is one of the charcteristics of this system. The new detection systems in the X-Lab 2000 show an improved signal-to-shelf and signal-to-tail ratio by a factor of 2-5. This especially is beneficial for the analysis of trace element contents next to high concentration element fluorescence lines.
The universal X-Lab 2000 especially is used in those applications, where with little sample preparation a large number of elemental concentrations need to be determined. The element range covers all elements from Na- U. The unique data processing algorithms allow an analysis without any further input of sample matrix. For many elements LODs in the range of less than 1 mg/kg are reached.
Typically the instrument is used for environmental samples ( filters, soil, sludges ) as well as in the recycling industry. It also often is used in geological applications as well as in pharmaceuticals’ process control.
Using polarized excitation radiation together with a Pd target end window tube gives the advantage of a high sensitivity analysis of the element range Na- U in a wide range of matrices. The Si(Li) semiconductor detector with improved characteristics together with the analyzer software fit together to a instrument, which is regarded as the benchmark in high sensitivity EDXRF.
SPECTRO - the global leader in Optical Emission and XRF Spectroscopy, is a multinational company committed to innovation, instrumentation support and service. With more than 500 employees, SPECTRO has shipped over 19,000 instruments to customers throughout the world. SPECTRO is committed to producing advanced products, better and more diverse solutions, and providing an unparalleled support infrastructure.
In 2003, SPECTRO presented the new 200T successor SPECTRO PHOENIX to the public for the first time. The SPECTRO PHOENIX now has a larger chamber for the sample material, comes with a network interface, and is even more robust than its predecessor. The system was also updated with reference to the newest analysis guidelines and is suitable for a wide range of applications.
Since its introduction to the market in 1991, the SPECTRO 200 / 200T has maintained its claim to the top of the market segment for compact bench top X-ray fluorescence analysis instruments. So that it stays there, the SPECTRO developers went to work. The result: a new instrument and a fitting new name.
The product brochure is available at our intranet website.
||SPECTRO Launches the new SPECTRO MIDEX at Pittcon exhibition
Benchtop system provides quick, non-destructive determination of elemental composition for Jewelry and Dental alloys. The analyzer is also well suited for forensic science applications.
SPECTRO Analytical Instruments, a leading global supplier of spectrometers, introduces a new "pinhole" XRF (X-ray fluorescence) analyzer designed specifically to meet the needs of jewelry and dental alloys analysis as well as those of forensics laboratories. The new SPECTRO MIDEX analyzer uses state-of-the-art XRF technology and proprietary beam collimation techniques to ensure the easiest, most accurate measurement results possible within a typical 2-3-minute response time.
Using a collimated X-ray beam means that the sample itself, or the region analyzed on the sample, can be extremely small. As a result, composition of irregular surfaces, small metal fragments, and even metallic coatings can be measured quickly, accurately, and reliably.
Simple principle of operation
SPECTRO MIDEX spectrometers use an air-cooled, low-power X-ray tube. The beam excites the elements in the sample, causing them to emit fluorescence radiation that contains information on the quantitative and qualitative elemental composition of the sample. An advanced semiconductor detector converts the fluorescence radiation into an output signal proportional to the spectral energies emitted. None of the sample material is destroyed, a significant benefit for forensic and medical laboratories.
||Minimal sample preparation / universal method for numerous applications / Energy-dispersive X-ray fluorescence analysis conforms to procedures described in pharmacopoeia
Based on the energy-dispersive XRF spectrometer SPECTRO X-LAB 2000, SPECTRO has developed a system that offers pharmaceutical laboratories a time saving method for multi-elemental analyses. The instrument conforms to the regulations of national and international pharmacopoeia, e.g. the 3rd edition of the European Pharmacopoeia.
With this new application, SPECTRO provides a cost-effective solution to a considerable problem in quality assurance during the production of pharmaceutical products: the analyses procedures described in the pharmacopoeia for the determination of contaminants in some cases require extensive sample preparation and often exhibit an unsatisfactory reproducibility of the results. In addition, numerous wet-chemical methods are proposed, each of which require the test setup to be adapted to the matrix of the sample. Thus, the routine testing of raw and auxiliary materials, active ingredients, as well as intermediate and end products for heavy metals from a wide range of potential contamination sources, is a significant cost and time factor.
||No nitrogen cooling required / Convenient operation: only one calibration for the measurement range from "sulfur-free" to 500 mg/kg
February 2003 With the energy-dispersive XRF system SPECTRO XEPOS for the analysis of sulfur in fuels, SPECTRO advances into measurement ranges that were previously restricted to the significantly more expensive wavelength-dispersive XRF instruments. The bench top XEPOS achieves a detection limit of less than 1 mg/kg for sulfur in fuels.
Recently there has been an international push to reduce the limits of sulfur in fuels. By 2010, the maximum allowed content of sulfur will decrease to 10 mg/kg in gasoline and 50 mg/kg in diesel fuel. For analyses methods used in the petrochemical industry this means, in turn, that the detection limit should be a factor of 10 less than the required limits. Thus, conventional energy-dispersive X-ray fluorescence analysis, the cost-effective and user-friendly standard method for oil laboratories, will become obsolete.
The technologically advanced ED-XRF SPECTRO XEPOS, however, achieves the required sulfur detection limit of less than 1 mg/kg. The primary reason for this can be found in the proprietary polarized excitation radiation, which enables an almost complete suppression of the spectral background, increasing sensitivity by a factor of four versus conventional energy-dispersive X-ray fluorescence spectrometers. A high-resolution, peltier cooled, Si drift chamber is used as a detection system, eliminating the need for liquid nitrogen cooling.
||Spectro has developed an energy-dispersive XRF system designed to meet soon-to-be-introduced EU directives for determining heavy metal content for " end of life vehicles (ELV)" and "waste electrical and electronic equipment (WEEE). According to Spectro, its XEPOS instrument has "proven to be the ideal instrument for determining cadmium, lead, mercury and chromium at the limits set for ELV and the still-to-be-set limits for WEEE. Proprietary polarisation technology provides a detection limit of 8ppm, an "improvement by a factor of four-to-seven versus conventional ED-XRF"
||Spectro has reduced the staff from 550 to 420 people
The organization is quite similar to ours: regional offices for Asia (Hong-Kong and Beijing), NAFTA (Fitchburgh, MA), Europe (Kleve), DACH & Benelux (Kleve) and Rest Of the World (Kleve). In the regional centers specialists are located to assists the sales-force, a similar set-up for after-sales is not in place yet.
||The Italian subsidiary of Spectro Analytical Instruments GmbH&Co has appointed six new local sales agencies. Among the appointments, Assing SpA (Monerotondo), an established distributor of electron microscopy and X-ray instrumentation, is now the exclusive agent for Spectro’s XRF products across most of Italy. Spectro Italia’s general manager, Stefano Pintossi, said that the changes brought the company "closer to our existing customer base of more than 850 installed units in Italy" and effectively doubled the commercial and technical capabilities of Spectro in the region.
||New relation between Omega systems and an ex Spectro worker:
Dr. Schramm worked for Spectro until June 2002. He started in Spectro about 8 years ago. He has a chemical background and was responsible for the development of the Xepos. His job in Spectro was the sales manager for the EDX systems in Europe. In June this year he started his own business selling sample cups and parts for sample preparation. He is now the European sales representative for a American sample preparation company (I think it is Spex). He is located in Kleve in the same building of the company HD Electronic. The owner of HD Electronic is Mr. Dzierzawa, some of you already know him. I heard from Mr. Dzierzawa and Dr. Schramm that they met Wil de Jongh jr. and that there will be a cooperation between their companies and Dr. Schramm will sell, install and train UniQuant. They are also working on a sample preparation method of glass beads for Ferro alloys. This will be finished beginning of 2003 and will be offered to UniQuant users.
||SPECTRO Italy appoints new sales Agencies to expand its customer sales and support coverage in the Italian territory
ASSING S.p.A. of Monterotondo (RM) has been appointed the exclusive agency for SPECTRO XRF products in most of the Italian territory. ASSING is an established distributor of electron microscopy and X-ray instrumentation serving the Italian industrial and academic markets since 1971. Headquartered in Monterotondo, near Rome, and with offices in Milan and Catania it counts with an experienced and knowledgeable staff ready to address the opportunities and potential of SPECTRO XRF product lines (X-lab, X-test and Xepos) and to provide a high level of customer attention.